Inferable from their novel actual properties, nanostructured materials are presently at the forefront of materials science. A few unique methods can be utilized to portray their tiny elements, yet each of these has its upsides and downsides. In a new exploration distributed in The European Physical Journal Special Topics, Jen Gubicza at ELTE Eötvös Loránd University, Budapest, shows that one aberrant strategy, named X-beam diffraction line profile examination (XLPA), is reasonable for dissecting nanostructured materials, yet its application and translation require unique consideration for getting solid ends. Nanostructured materials comprise nanoscale grains, each made out of a precise nuclear grid.